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Direct observation of grain-boundary diffusion by scanning Auger microscopyJanssen, A. P.; Venables, J. A.; Hwang, J. C. M.; Balluffi, R. W. · Philosophical Magazine · 1977
Effect of surface condition on diffusion in thin films at low temperaturesHwang, J. C. M.; Ho, P. S.; Balluffi, R. W. · Applied Physics Letters · 1978
Measurement of grain-boundary diffusion at low temperature by the surface-accumulation method. II. Results for gold-silver systemHwang, J. C. M.; Pan, J. D.; Balluffi, R. W. · Journal of Applied Physics · 1979
Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988
Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006
Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000
Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000
Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008
Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008
Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005
Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013