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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - PUF modeling attacks: An introduction and overviewRuhrmair, Ulrich; Solter, Jan · 2014
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - PUF modeling attacks: An introduction and overviewRuhrmair, Ulrich; Solter, Jan · 2014
[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Ultra-Low Power: An EDA ChallengeGrimm, Christoph; Moreno, Javier; Pan, Xiao · 2013
[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - An Efficient Wirelength Model for Analytical PlacementRay, B.N.B.; Balachandran, Shankar · 2013
[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - An Approximate Voting Scheme for Reliable ComputingChen, Ke; Lombardi, Fabrizio; Han, Jie · 2015
[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Bordersearch: An Adaptive Identification of Failure RegionsDobler, Markus; Harrant, Manuel; Rafaila, Monica; Pelz, Georg; Rosenstiel, Wolfgang; Bogdan, Martin · 2015
[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - An Extremely Compact JPEG Encoder for Adaptive Embedded SystemsSchneider, Josef; Parameswaran, Sri · 2013
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - An embedded offset and gain instrument for OpAmp IPsWan, Jinbo; Kerkhoff, Hans G. · 2014
[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Automatic construction of models for analytic system-level design space exploration problemsAttarzadeh-Niaki, Seyed-Hosein; Sander, Ingo · 2017
[IEEE 2013 Euromicro Conference on Digital System Design (DSD) - Los Alamitos, CA, USA (2013.09.4-2013.09.6)] 2013 Euromicro Conference on Digital System Design - Towards a Modelling and Design Framework for Mixed-Criticality SoCs and Systems-of-SystemsHerrera, Fernando; Niaki, Seyed Hosein Attarzadeh; Sander, Ingo · 2013
[IEEE 2015 10th IEEE International Symposium on Industrial Embedded Systems (SIES) - Siegen, Germany (2015.6.8-2015.6.10)] 10th IEEE International Symposium on Industrial Embedded Systems (SIES) - A formal, model-driven design flow for system simulation and multi-core implementationDiallo, Papa Issa; Attarzadeh-Niaki, Seyed-Hosein; Robino, Francesco; Sander, Ingo; Champeau, Joel; Oberg, Johnny · 2015
[IEEE 2015 18th CSI International Symposium on Computer Architecture and Digital Systems (CADS) - Tehran, Iran (2015.10.7-2015.10.8)] 2015 18th CSI International Symposium on Computer Architecture and Digital Systems (CADS) - Integrating Functional Mock-up units into a formal heterogeneous system modeling frameworkAttarzadeh-Niaki, Seyed-Hosein; Sander, Ingo · 2015