![[IEEE 2002 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (22 June 2002)] Proceedings 2002 IEEE Hong Kong Electron Devices Meeting (Cat. No.02TH8616) - Electrical characteristics of novel hafnium oxide film]()
[IEEE 2002 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (22 June 2002)] Proceedings 2002 IEEE Hong Kong Electron Devices Meeting (Cat. No.02TH8616) - Electrical characteristics of novel hafnium oxide filmNg, K.L.; Zhan, N.; Poon, M.C.; Kok, C.W.; Chan, M.; Wong, H. · 2002