![[ASME ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference - San Francisco, California, USA (July 17–22, 2005)] Advances in Electronic Packaging, Parts A, B, and C - High Precision Young’s Modulus Extraction of Thin Films Through Measuring the Electric-Circuit Behavior of Microstructures]()
[ASME ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference - San Francisco, California, USA (July 17–22, 2005)] Advances in Electronic Packaging, Parts A, B, and C - High Precision Young’s Modulus Extraction of Thin Films Through Measuring the Electric-Circuit Behavior of MicrostructuresHu, Yuh-Chung; Gau, Wei-Hsin; Tu, Wei-Hsiang · 2005