![[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Rapid FPGA delay characterization using clock synthesis and sparse sampling]()
[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Rapid FPGA delay characterization using clock synthesis and sparse samplingMajzoobi, Mehrdad; Dyer, Eva; Elnably, Ahmed; Koushanfar, Farinaz · 2010