The Allosteric Mechanism of Activation of Antithrombin as an Inhibitor of Factor IXa and Factor Xa: HEPARIN-INDEPENDENT FULL ACTIVATION THROUGH MUTATIONS ADJACENT TO HELIX D
- 期刊名称Journal of Biological Chemistry
- 作者Dementiev, A.; Swanson, R.; Roth, R.; Isetti, G.; Izaguirre, G.; Olson, S. T.; Gettins, P. G. W.
- 卷第288卷
- 期第47期
- 印刷ISSN0021-9258
- 电子ISSN1083-351X
- 文件大小2045.89KB
- 发表时间2013-11-22
- DOI10.1074/jbc.M113.510727
- 页码33611-33619
Microscopic Modeling of HfO<sub><italic>x</italic></sub> RRAM Operations: From Forming to SwitchingPadovani, Andrea; Larcher, Luca; Pirrotta, Onofrio; Vandelli, Luca; Bersuker, Gennadi · IEEE Transactions on Electron Devices · 2015
Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide DielectricsVandelli, Luca; Padovani, Andrea; Larcher, Luca; Bersuker, Gennadi · IEEE Transactions on Electron Devices · 2013
Charge transport in high-κ stacks for charge-trapping memory applications: A modeling perspective (invited)Luca Larcher; Andrea Padovani; Luca Vandelli; Paolo Pavan · 2011
A Compact Model of Program Window in HfO<sub><italic>x</italic></sub> RRAM Devices for Conductive Filament Characteristics AnalysisLarcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi · IEEE Transactions on Electron Devices · 2014
Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS MemoriesSuhane, Amit; Arreghini, Antonio; Van den bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan · IEEE Electron Device Letters · 2010
Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliabilityPadovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; bosch, Geert Van den; Houdt, Jan Van · Applied Physics Letters · 2012
[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - A microscopic physical description of RTN current fluctuations in HfO<inf>x</inf> RRAMPuglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca · 2015
IntroductionMacucci, Massimo · Journal of Computational Electronics · 2012
Quantum transport beyond DCOriols, X.; Ferry, D. K. · Journal of Computational Electronics · 2013
Modeling of laser annealingFisicaro, G.; La Magna, A. · Journal of Computational Electronics · 2014
IntroductionPelaz, Lourdes · Journal of Computational Electronics · 2014
Atomistic modeling of semiconductor interfacesBlom, Anders; Stokbro, Kurt · Journal of Computational Electronics · 2013
On pseudomagnetoresistance in graphene junctionsBala Kumar, S.; Guo, J. · Journal of Computational Electronics · 2013
DNA: hardware and software of lifeLucas, Amand · Journal of Computational Electronics · 2014
IntroductionPhilippe Dollfus,Denis Rideau · Journal of Computational Electronics · 2013