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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Comparison of NTBI and irradiation induced interface states

[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Comparison of NTBI and irradiation induced interface states

Kambour, K. E.; Nguyen, D. D.; Kouhestani, C.; Devine, R. A. B.
  • 作者Kambour, K. E.; Nguyen, D. D.; Kouhestani, C.; Devine, R. A. B.
  • 文件大小309.58KB
  • 发表时间2013
  • DOI10.1109/iirw.2013.6804183
  • 页码157-160
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