![[IEEE 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting 2000 - Minneapolis, MN, USA (24-26 Sept. 2000)] Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) - ESD robustness of a BiCMOS SiGe technology]()
[IEEE 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting 2000 - Minneapolis, MN, USA (24-26 Sept. 2000)] Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) - ESD robustness of a BiCMOS SiGe technologyVoldman, S.; Juliano, P.; Schmidt, N.; Botula, A.; Johnson, R.; Lanzerotti, L.; Feilchenfeld, N.; Joseph, J.; Malinowski, J.; Eld, E.; Gross, V.; Brennan, C.; Dunn, J.; Harame, D.; Herman, D.; Meyerson, B. · 2000