![SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - A novel low-cost high-throughput probe card scanner analyzer for characterization of magnetic tunnel junctions]()
SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - A novel low-cost high-throughput probe card scanner analyzer for characterization of magnetic tunnel junctionsPong, Philip W. T.; Postek, Michael T.; Allgair, John A.; Schmoueli, Moshe; Marcus, Eliezer; Egelhoff, Jr., William F. · 2007