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CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY OF BURIED HETEROSTRUCTURE LASERSCOBLEY, R. J.; TENG, K. S.; BROWN, M. R.; MAFFEÏS, T. G. G.; WILKS, S. P. · International Journal of Nanoscience · 2004
Modeling multiple quantum barrier effects and reduced electron leakage in red-emitting laser diodesBrown, M. R.; Cobley, R. J.; Teng, K. S.; Rees, P.; Wilks, S. P.; Sobiesierski, A.; Smowton, P. M.; Blood, P. · Journal of Applied Physics · 2006
Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopyCobley, R. J.; Teng, K. S.; Brown, M. R.; Wilks, S. P.; Rees, P. · Applied Physics Letters · 2007
Investigation on (Al[sub 0.7]Ga[sub 0.3])[sub 0.5]In[sub 0.5]P∕(Al[sub 0.3]Ga[sub 0.7])[sub 0.5]In[sub 0.5]P multi-quantum-barrier superlattice using cross-sectional scanning tunneling microscopyTeng, K. S.; Cobley, R. J.; Brown, M. R.; Wilks, S. P.; Dunstan, P. R. · Journal of Applied Physics · 2005
Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988
Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006
Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000
Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000
Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008
Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008
Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005
Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013