![[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applications]()
[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applicationsLiu, Wen; Liou, Juin J.; You Li, ; Chung, J.; Jeong, Y. H. · 2010