Experimental study on SET/RESET conditions for graphene resistive random access memory
- 期刊名称Japanese Journal of Applied Physics
- 作者Shindome, Aya; Takahashi, Tsunaki; Oda, Shunri; Uchida, Ken
- 卷第53卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小2951.35KB
- 发表时间2014-01-01
- DOI10.7567/JJAP.53.04EN02
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