Special Issue on Mobile Systems
- 期刊名称IEEE Micro
- 作者Cascaval, Calin
- 卷第35卷
- 期第1期
- 印刷ISSN0272-1732
- 文件大小148.37KB
- 发表时间2015-1
- DOI10.1109/mm.2015.21
- 页码4-5
Band Tailings and Deep Defects in Semiconductors: IntroductionTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Band Tailings and Deep Defects in Semiconductors: ConclusionsTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Band Tailings and Deep Defects in Semiconductors: Theory and FormalismTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Band Tailings and Deep Defects in Semiconductors: List of ReferencesTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Band Tailings and Deep Defects in Semiconductors: Electron-Phonon InteractionTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Band Tailings and Deep Defects in Semiconductors: Self-Consistent TheoryTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Band Tailings and Deep Defects in Semiconductors: Appendix A: General Derivation of Initial State DecayTeate, A.A.; Halder, N.C. · Defect and Diffusion Forum · 1996
Oxidation of High Technology MaterialsPhilibert, Jean · Defect and Diffusion Forum · 1988
Diffusion in Solids under PressureMehrer, Helmut · Defect and Diffusion Forum · 2011
Thermodynamic Diffusion CoefficientsKale, G.B. · Defect and Diffusion Forum · 2008
SemiconductorsDefect and Diffusion Forum · 1989
Reactive Diffusion and StressesGusak, Andriy; Lyashenko, Yu.A.; Bogatyrev, A.O. · Defect and Diffusion Forum · 1996
Diffusion and StressesPhilibert, Jean · Defect and Diffusion Forum · 1996
Adolf Fick and Diffusion EquationsPhilibert, Jean · Defect and Diffusion Forum · 2006
Diffusion and MeltingTiwari, G.P.; Mehrotra, R.S. · Defect and Diffusion Forum · 2008