![[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy]()
[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron SpectroscopyKakushima, Kuniyuki; Okamoto, Kouichi; Tachi, Kiichi; Sato, Soushi; Song, Jaeyeol; Kawanago, Takamasa; Ahmet, Parhat; Sugii, Nobuyuki; Tsutsui, Kazuo; Hattori, Takeo; Iwai, H. · 2009