![On the use of a ZrOx-SiO2multilayer structure as a test sample for high-resolution X-ray microscopy]()
On the use of a ZrOx-SiO2multilayer structure as a test sample for high-resolution X-ray microscopyMedvedeva, S. S.; Lyatun, I. I.; Ershov, P. A.; Goikhman, A. Yu.; Snigireva, I. I.; Snigirev, A. A. · Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques · 2015