![Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices]()
Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction DevicesBissig, Benjamin; Guerra-Nunez, Carlos; Carron, Romain; Nishiwaki, Shiro; La Mattina, Fabio; Pianezzi, Fabian; Losio, Paolo A.; Avancini, Enrico; Reinhard, Patrick; Haass, Stefan G.; Lingg, Martina; Feurer, Thomas; Utke, Ivo; Buecheler, Stephan; Tiwari, Ayodhya N. · Small · 2016