![SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Wavelength calibration and spectral line bending determination of an imaging spectrometer]()
SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Wavelength calibration and spectral line bending determination of an imaging spectrometerChen, Yuheng; Zhang, Kun; Wang, Xiang-jun; Ji, Yiqun; Zhou, Jiankang; Zhang, Guang-jun; Ai, Ke-cong; Chen, Xinhua; Wei, XiaoXiao; Shen, Weimin · 2009