Modeling and Evaluating the Gate Length Dependence of BTI
- 期刊名称IEEE Transactions on Circuits and Systems II: Express Briefs
- 作者van Santen, Victor M.; Amrouch, Hussam; Henkel, Jorg
- 印刷ISSN1549-7747
- 电子ISSN1558-3791
- 文件大小462.30KB
- 发表时间2018
- DOI10.1109/TCSII.2018.2885850
- 页码1-1
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