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Direct Nanoscale Characterization of Deep Levels in AgCuInGaSe
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Using Electron Energy‐Loss Spectroscopy in the Scanning Transmission Electron Microscope

Direct Nanoscale Characterization of Deep Levels in AgCuInGaSe ₂ Using Electron Energy‐Loss Spectroscopy in the Scanning Transmission Electron Microscope

Deitz, Julia I.; Paul, Pran K.; Farshchi, Rouin; Poplavskyy, Dmitry; Bailey, Jeff; Arehart, Aaron R.; McComb, David W.; Grassman, Tyler J.

期刊名称Advanced Energy Materials
作者Deitz, Julia I.; Paul, Pran K.; Farshchi, Rouin; Poplavskyy, Dmitry; Bailey, Jeff; Arehart, Aaron R.; McComb, David W.; Grassman, Tyler J.
印刷ISSN1614-6832
电子ISSN1614-6840
文件大小1110.63KB
发表时间2019-08-05
DOI10.1002/aenm.201901612

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