Corona Ellipses
- 期刊名称Transactions of the American Institute of Electrical Engineers
- 作者Karapetoff, Vladimir
- 卷第48卷
- 期第2期
- 印刷ISSN0096-3860
- 文件大小1968.58KB
- 发表时间1929-04
- DOI10.1109/t-aiee.1929.5055219
- 页码317-326
[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - 6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOSCakir, Cagla; Bhargava, Mudit; Mai, Ken · 2012
[IEEE 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - San Francisco, CA, USA (2012.06.3-2012.06.4)] 2012 IEEE International Symposium on Hardware-Oriented Security and Trust - Reliability enhancement of bi-stable PUFs in 65nm bulk CMOSBhargava, Mudit; Cakir, Cagla; Mai, Ken · 2012
[IEEE 2010 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST 2010) - Anaheim, CA (2010.06.13-2010.06.14)] 2010 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Attack resistant sense amplifier based PUFs (SA-PUF) with deterministic and controllable reliability of PUF responsesBhargava, Mudit; Cakir, Cagla; Mai, Ken · 2010