![[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Revisiting random access scan for effective enhancement of post-silicon observability]()
[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Revisiting random access scan for effective enhancement of post-silicon observabilityKumar, Binod; Jindal, Ankit; Tudu, Jaynarayan; Pandey, Brajesh; Singh, Virendra · 2017