[IEEE 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Grenoble, France (2014.6.30-2014.7.3)] 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Test and diagnosis of FPGA cluster using partial reconfigurationRehman, Saif Ur; Benabdenbi, Mounir; Anghel, Lorena · 2014

[IEEE 2014 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Tampa, FL, USA (2014.7.9-2014.7.11)] 2014 IEEE Computer Society Annual Symposium on VLSI - Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGARehman, Saif Ur; Blanchardon, Adrien; Dhia, Arwa Ben; Benabdenbi, Mounir; Chotin-Avot, Roselyne; Naviner, Lirida; Anghel, Lorena; Mehrez, Habib; Amouri, Emna; Marrakchi, Zied · 2014

[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Efficient link-level error resilience in 3D NoCsPasca, Vladimir; Rehman, Saif-Ur; Anghel, Lorena; Benabdenbi, Mounir · 2012

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Application-independent testing of multilevel interconnect in mesh-based FPGAsRehman, Saif Ur; Benabdenbi, Mounir; Anghel, Lorena · 2015

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - BIST for logic and local interconnect resources in a novel mesh of cluster FPGARehman, Saif-Ur; Benabdenbi, Mounir; Anghel, Lorena · 2013