Unitary analytic representations of SL(3,R)
- 期刊名称Journal of Mathematical Physics
- 作者Güler, Y.
- 卷第18卷
- 期第3期
- 印刷ISSN0022-2488
- 文件大小509.97KB
- 发表时间1977
- DOI10.1063/1.523284
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Committees2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Awards2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Biographies2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Copyright2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Announcement2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - PrefaceMoore, Tom · 2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Tutorial program2010
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Adaptive sensing and design for reliabilitySingh, P.; Sylvester, D.; Blaauw, D. · 2010
[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Isolating light-sensitive defects using C-AFMLin, Hung Sung; Wu, Mong Sheng · 2011
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A case study of high temperature pass analysis using thermal laser stimulation techniqueLin, Hung Sung; Wu, Mong Sheng · 2010
[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A study bipolar phototransistor action existing in CMOS process triggered by a laser beam used in a C-AFM systemHung-Sung Lin, ; Mong-Sheng Wu, ; Tsui-Hua Huang, · 2009
[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - An application of C-AFM as a tool for SRAM soft single-column failure analysis in advanced HV technologiesHung-Sung Lin, ; Mong-Sheng Wu, ; Yun-Ming Tsou, · 2008