![[IEEE The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. - Traverse City, MI, USA (2006.06.4-2006.06.8)] The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. - Characterization of materials with low secondary electron yield for use in high-power microwave devices]()
[IEEE The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. - Traverse City, MI, USA (2006.06.4-2006.06.8)] The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. - Characterization of materials with low secondary electron yield for use in high-power microwave devicesKumar, P.; Svimonishvili, T.; Watts, C.; Gilmore, M.; Bowers, L.; Gaudet, J.; Schamiloglu, E. · 2006