![[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Microscopy Study of Fretting Corrosion Caused by the Tin Plating Thickness]()
[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Microscopy Study of Fretting Corrosion Caused by the Tin Plating ThicknessIto, Tetsuya; Sawada, Shigeru; Hattori, Yasuhiro; Saitoh, Yasushi; Tamai, Terutaka; Iida, Kazuo · 2008