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[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Interaction efficiency of an emission gated TWT

[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Interaction efficiency of an emission gated TWT

Kodis, M.A.; Freund, H.P.; Vanderplaats, N.R.; Zaidman, E.G.

作者Kodis, M.A.; Freund, H.P.; Vanderplaats, N.R.; Zaidman, E.G.
文件大小264.36KB
发表时间1991
DOI10.1109/iedm.1991.235401
页码589-592

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