海量图书期刊资源，随时随地畅享阅读乐趣
New transient characterization of latchup phenomenon in CMOS cellF.M. Roche; S.D. Bocus; P. Girard; R. Barille · 1992
Effect of well and substrate parameters on the latchup degradation of CMOS structures during e-beam voltage contrast measurementsF.M. Roche; S.D. Bocus; P. Girard · 1991