[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Yokohama, Japan (23-25 May 1995)] Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Simulations and measurements of emitter properties in 5 kV Si PIN diodes
Tornblad, O.; Domeij, M.; Breitholtz, B.; Linnros, J.; Ostling, M.
- 作者Tornblad, O.; Domeij, M.; Breitholtz, B.; Linnros, J.; Ostling, M.
- 文件大小420.00KB
- 发表时间1995
- DOI10.1109/ispsd.1995.515067
- 页码380-384