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[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Yokohama, Japan (23-25 May 1995)] Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Simulations and measurements of emitter properties in 5 kV Si PIN diodes

[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Yokohama, Japan (23-25 May 1995)] Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Simulations and measurements of emitter properties in 5 kV Si PIN diodes

Tornblad, O.; Domeij, M.; Breitholtz, B.; Linnros, J.; Ostling, M.
  • 作者Tornblad, O.; Domeij, M.; Breitholtz, B.; Linnros, J.; Ostling, M.
  • 文件大小420.00KB
  • 发表时间1995
  • DOI10.1109/ispsd.1995.515067
  • 页码380-384
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