海量图书期刊资源,随时随地畅享阅读乐趣
The optimistic update theorem for path delay testing in sequential circuitsSoumitra Bose; Prathima Agrawal; Vishwani D. Agrawal · 1993
[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Delay fault simulation with bounded gate delay modeBose, Soumitra; Grimes, Hillary; Agrawal, Vishwani D. · 2007
[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Estimating stuck fault coverage in sequential logic using state traversal and entropy analysisBose, Soumitra; Agrawal, Vishwani D. · 2007