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[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Concurrent scan monitoring and multi-pattern search

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Concurrent scan monitoring and multi-pattern search

dos Santos, J.M.V.

作者dos Santos, J.M.V.
文件大小184.73KB
发表时间2000
DOI10.1109/olt.2000.856621
页码107-111

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