Scanning transmission electron microscopy study of Au/Zn/Au/Cr/Au and Au/Ti/Pt/Au/Cr/Au contacts to p-type InGaAs/InP
- 期刊名称Journal of Applied Physics
- 作者Huang, J. S.; Vartuli, C. B.
- 卷第93卷
- 期第9期
- 印刷ISSN0021-8979
- 文件大小1424.35KB
- 发表时间2003
- DOI10.1063/1.1565187
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