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[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon DecodersPontarelli, S.; Sterpone, L.; Cardarilli, G.C.; Re, M.; Reorda, M. Sonza; Salsano, A.; Violante, M. · 2007

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Optimization of Self Checking FIR filters by means of Fault Injection AnalysisPontarelli, S.; Sterpone, L.; Cardarilli, G.C.; Re, M.; Reorda, M. Sonza; Salsano, A.; Violante, M. · 2007

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologiesBolchini, C.; Miele, A.; Sandionigi, C.; Ottavi, M.; Pontarelli, S.; Salsano, A.; Metra, C.; Omana, M.; Rossi, D.; Reorda, M. Sonza; Sterpone, L.; Violante, M.; Gerardin, S.; Bagatin, M.; Paccagnella, A. · 2012