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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Optimization of Self Checking FIR filters by means of Fault Injection Analysis

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Optimization of Self Checking FIR filters by means of Fault Injection Analysis

Pontarelli, S.; Sterpone, L.; Cardarilli, G.C.; Re, M.; Reorda, M. Sonza; Salsano, A.; Violante, M.
  • 作者Pontarelli, S.; Sterpone, L.; Cardarilli, G.C.; Re, M.; Reorda, M. Sonza; Salsano, A.; Violante, M.
  • 文件大小340.56KB
  • 发表时间2007
  • DOI10.1109/dft.2007.23
  • 页码96-104
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