![[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - A coherent subsampling test system arrangement suitable for phase domain measurements]()
[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - A coherent subsampling test system arrangement suitable for phase domain measurementsCho, Young Gouk; Roberts, Gordon W.; Aouini, Sadok; Parvizi, Mahdi; Ben-Hamida, Naim · 2018