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Functional delay test generation based on software prototypeEduardas Bareisa; Vacius Jusas; Kestutis Motiejunas; Rimantas Seinauskas · 2009
Path delay test generation at functional levelBareisa, Eduardas; Jusas, Vacius; Motiejunas, Kestutis; Seinauskas, Rimantas · IET Computers & Digital Techniques · 2015
Delay fault testing using partial multiple scan chainsBareisa, Eduardas; Jusas, Vacius; Motiejunas, Kestutis; Seinauskas, Rimantas · Microelectronics Reliability · 2013
Functional fault models for non-scan sequential circuitsEduardas Bareisa; Vacius Jusas; Kestutis Motiejunas; Rimantas Seinauskas · 2011
Test generation at the algorithm-level for gate-level fault coverageEduardas Bareisa; Vacius Jusas; Kestutis Motiejunas; Rimantas Seinauskas · 2008