[IEEE 2013 International Conference on 3D Imaging (IC3D) - Liège, Belgium (2013.12.3-2013.12.5)] 2013 International Conference on 3D Imaging - Obstacle detection for pedestrians with a visual impairment based on 3D imaging
- 作者Vlaminck, Michiel; Jovanov, Ljubomir; Van Hese, Peter; Goossens, Bart; Philips, Wilfried; Pizurica, Aleksandra
- 文件大小537.95KB
- 发表时间2013
- DOI10.1109/ic3d.2013.6732091
- 页码1-7
[IEEE Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (1995.11.27-1995.12.1)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA-95 - Author's index1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Poly-3 bitline crack [DRAMs]Tan, W.; Lee Keat Peng, ; Giam Siang Tian, · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Oxidation of copper leadframeAng, G.L.; Goh, L.C.; Heng, K.W.; Lahiri, S.K. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Fault isolation on mixed signal deviceTan, K.T.; Ong, S.H.; Yong, C.T. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICsAnderson, W.T.; Roussos, J.A.; Christianson, K.A. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - VMESS: VLSI mechanical stress simulatorBhattacharyya, A.B.; Singh, D.N.; Metha, R.; Goswami, I. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IGBT power semiconductor reliability analysis for traction applicationJacob, P.; Held, M.; Scacco, P. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Surface analysis and application in magnetic hard disk mediaGopalakrishnan, R. · 1995