![[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - A systematic approach to statistical simulation of complex analog integrated circuits]()
[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - A systematic approach to statistical simulation of complex analog integrated circuitsSwidzinski, J.F.; Alexander, D.; Qu, M.; Styblinski, M.A. · 1997