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Calibrated nanoscale capacitance measurements using a scanning microwave microscopeHuber, H. P.; Moertelmaier, M.; Wallis, T. M.; Chiang, C. J.; Hochleitner, M.; Imtiaz, A.; Oh, Y. J.; Schilcher, K.; Dieudonne, M.; Smoliner, J.; Hinterdorfer, P.; Rosner, S. J.; Tanbakuchi, H.; Kabos, P.; Kienberger, F. · Review of Scientific Instruments · 2010

Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988

Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006

Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000

Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000

Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008

Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008

Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005

Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013