![Intermittent-contact Scanning Electrochemical Microscopy (IC-SECM) as a Quantitative Probe of Defects in Single Crystal Boron Doped Diamond Electrodes]()
Intermittent-contact Scanning Electrochemical Microscopy (IC-SECM) as a Quantitative Probe of Defects in Single Crystal Boron Doped Diamond ElectrodesTomlinson, Lucy I.; Patten, Hollie V.; Green, Ben L.; Iacobini, James; Meadows, Katherine E.; McKelvey, Kim; Unwin, Patrick R.; Newton, Mark E.; Macpherson, Julie V. · Electroanalysis · 2016