![[IEEE Eleventh Biennial University/Government/ Industry Microelectronics Symposium - Austin, TX, USA (16-17 May 1995)] Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium - Breakdown mechanisms and stress-induced leakage current in ultra-thin oxides and N/sub 2/O oxynitrides]()
[IEEE Eleventh Biennial University/Government/ Industry Microelectronics Symposium - Austin, TX, USA (16-17 May 1995)] Proceedings of the Eleventh Biennial University/Government/ Industry Microelectronics Symposium - Breakdown mechanisms and stress-induced leakage current in ultra-thin oxides and N/sub 2/O oxynitridesChou, A.I.; Lai, K.; Kumar, K.; Chowdhury, P.; Ming-Yin Hao, ; Wei-Ming Chen, ; Gardner, M.; Fulford, J.; Lee, J.C. · 1995