Performance Evaluation of 7 nm Node Negative Capacitance FinFET based SRAM
Dutta, Tapas; Pahwa, Girish; Trivedi, Amit Ranjan; Sinha, Saurabh; Agarwal, Amit; Chauhan, Yogesh Singh
- 期刊名称IEEE Electron Device Letters
- 作者Dutta, Tapas; Pahwa, Girish; Trivedi, Amit Ranjan; Sinha, Saurabh; Agarwal, Amit; Chauhan, Yogesh Singh
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小2859.44KB
- 发表时间2017
- DOI10.1109/LED.2017.2712365
- 页码1-1