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Performance Evaluation of 7 nm Node Negative Capacitance FinFET based SRAM

Performance Evaluation of 7 nm Node Negative Capacitance FinFET based SRAM

Dutta, Tapas; Pahwa, Girish; Trivedi, Amit Ranjan; Sinha, Saurabh; Agarwal, Amit; Chauhan, Yogesh Singh
  • 期刊名称IEEE Electron Device Letters
  • 作者Dutta, Tapas; Pahwa, Girish; Trivedi, Amit Ranjan; Sinha, Saurabh; Agarwal, Amit; Chauhan, Yogesh Singh
  • 印刷ISSN0741-3106
  • 电子ISSN1558-0563
  • 文件大小2859.44KB
  • 发表时间2017
  • DOI10.1109/LED.2017.2712365
  • 页码1-1
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