[IEEE 2017 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) - Nottingham, United Kingdom (2017.4.20-2017.4.21)] 2017 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) - Electrical machines design
- 文件大小109.95KB
- 发表时间2017
- DOI10.1109/WEMDCD.2017.7947716
- 页码9-10
Electrical characteristics of silicon percolating nanonet-based field effect transistors in the presence of dispersionCazimajou, T.; Legallais, M.; Mouis, M.; Ternon, C.; Salem, B.; Ghibaudo, G. · Solid-State Electronics · 2017
Analysis of the role of inter-nanowire junctions on current percolation effects in silicon nanonet field-effect transistorsCazimajou, T.; Mouis, M.; Legallais, M.; Nguyen, T.T.T.; Ternon, C.; Salem, B.; Ghibaudo, G. · Solid-State Electronics · 2019
[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Low Temperature Electrical Characteristics of Si Nanonet Field Effect TransistorsCazimajou, T.; Legallais, M.; Nguyen, T.T.T.; Mouis, M.; Ternon, C.; Salem, B.; Ghibaudo, G. · 2019