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[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Novel Software Techniques for Automatic Microwave MeasurementsFerrero, A.; Madonna, G.L.; Pisani, U. · 1996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - New Applications for Pulsed/Isothermal Test SystemScott, Jonathan; Parker, Anthony; Rathmell, James; Sayed, Mohamed · 1996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Automatic RF Techniques Group Executive Committee Members January 31, 19961996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Development of On-Wafer Microstrip Characterization TechniquesPham, A.; Laskar, J.; Schappacher, J. · 1996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Waveform Measurements on a HEMT Resistive MixerSchreurs, D.; Verspecht, J.; Nauwelaers, B.; Barel, A.; van Rossum, M. · 1996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Transmission Response Measurements of Frequency Translating DevicesClark, C. J.; Moulthrop, A. A.; Muha, M. S.; Silva, C. P. · 1996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - A New Technique for Microwave Circuit Parameter MeasurementL'vov, A.A.; Semenov, K.V. · 1996
[IEEE 47th ARFTG Conference Digest - San Francisco, CA, USA (1996.06.20-1996.06.21)] 47th ARFTG Conference Digest - Vector Network Analyzer Check Standards Measurements and Database SoftwareDuda, Leonard E. · 1996
Asynchronous electro-optic sampling of all-electronically generated ultrashort voltage pulsesFüser, Heiko; Bieler, Mark; Ahmed, Sajjad; Verbeyst, Frans · Measurement Science and Technology · 2015
[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - System Identification Approach Applied to Jitter EstimationVerbeyst, Frans; Rolain, Yves; Schoukens, Johan; Pintelon, Rik · 2006
[IEEE 2013 82nd ARFTG Microwave Measurement Conference - Columbus, OH, USA (2013.11.18-2013.11.21)] 82nd ARFTG Microwave Measurement Conference - A phase calibration methodology for accurate modulated measurementsAhmed, Sajjad; Verbeyst, Frans; Vanden Bossche, Marc · 2013
[IEEE 2013 81st ARFTG Microwave Measurement Conference (ARFTG) - Seattle, WA (2013.6.7-2013.6.7)] 81st ARFTG Microwave Measurement Conference - Next-generation comb generators for accurate modulated measurementsVerbeyst, Frans; Bossche, Marc; Pailloncy, Guillaume · 2013
[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - System Identification Approach Applied to Drift EstimationVerbeyst, Frans; Pintelon, Rik; Rolain, Yves; Schoukens, Johan; Clement, Tracy S. · 2007
[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Enhanced Time Base Jitter Compensation of Sine WavesVerbeyst, Frans; Rolain, Yves; Pintelon, Rik; Schoukens, Johan · 2007
[IEEE 49th ARFTG Conference Digest - Denver, CO, USA (1997.06.13-1997.06.13)] 49th ARFTG Conference Digest - Characterizing Components Under Large Signal Excitation: Defining Sensible "Large Signal S-Parameters"?!Verspecht, Jan; vanden Bossche, Marc; Verbeyst, Frans · 1997