![The impact of SiN[sub x] gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress]()
The impact of SiN[sub x] gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stressJung, Ji Sim; Son, Kyoung Seok; Lee, Kwang-Hee; Park, Joon Seok; Kim, Tae Sang; Kwon, Jang-Yeon; Chung, Kwun-Bum; Park, Jin-Seong; Koo, Bonwon; Lee, Sangyun · Applied Physics Letters · 2010