![SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - High-resolution nondestructive evaluation at the Center for Materials Diagnosis]()
SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - High-resolution nondestructive evaluation at the Center for Materials DiagnosisMeyendorf, Norbert; Meyendorf, Norbert; Baaklini, George Y.; Sathish, Shamachary; Druffner, Carl J.; Michel, Bernd; Blackshire, James L.; Hoffmann, Jochen P.; Zhan, Qiwen; Andrews, Robert J. · 2004