Ultrastructural localization in host tissues of a toxic glycopeptide produced by Ophiostoma ulmi , using monoclonal antibodies
- 期刊名称Canadian Journal of Botany
- 作者Benhamou, Nicole; Lafontaine, J. G.; Joly, J. R.; Ouellette, G. B.
- 卷第63卷
- 期第7期
- 印刷ISSN0008-4026
- 电子ISSN1480-3305
- 文件大小2443.56KB
- 发表时间1985-07
- DOI10.1139/b85-164
- 页码1185-1195
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Design for ReliabilityTurner, Timothy · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A Spectroscopic SEM: First ResultsOsterberg, Mans; Khursheed, Anjam · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced Test Methodology and Strategies for SemiconductorsWest, Burnell · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Future of Nano-CMOS Technology and Its ProductionIwai, Hiroshi · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The rules of the Rue Morgue: a decade laterMura, G.; Vanzi, M.; Cassanelli, G.; Fantini, F. · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Application of EDS Technique for OSP Film Thickness MeasurementProng, K.; Sirarat, K. · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Diffractive lenses for high resolution laser based failure analysisZachariasse, Frank; Goossens, Martijn · 2006
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Lead frame Hillock-Induced Silicon CrackFlores, R.C.; Fabia, M.G.; Nabong, M.T.; Soria, A.O.; Gabunas, C.B. · 2006