Failure analysis requirements for nanoelectronicsVallett, D.P. · IEEE Transactions On Nanotechnology · 2002

IC failure analysis: the importance of test and diagnosticsVallett, D.P. · IEEE Design & Test of Computers · 1997

Time-resolved optical characterization of electrical activity in integrated circuitsTsang, J.C.; Kash, J.A.; Vallett, D.P. · 2000

[IEEE 2002 2nd IEEE Conference on Nanotechnology - Washington, DC, USA (26-28 Aug. 2002)] Proceedings of the 2nd IEEE Conference on Nanotechnology - Failure analysis requirements for nanoelectronicsVallett, D.P. · 2002

[IEEE 2005 IEEE LEOS Annual Meeting - Sydney, Australia (23-27 Oct. 2005)] 2005 IEEE LEOS Annual Meeting Conference Proceedings - Laser signal injection microscopy of Si integrated circuits with a numerical aperture increasing lensIppolito, S.B.; Goldberg, B.B.; Unlu, M.S.; Levin, T.M.; Vallett, D.P. · 2005

[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Future challenges in IC testing and fault isolationVallett, D.P. · 2003