[IEEE IJCNN-91-Seattle International Joint Conference on Neural Networks - Seattle, WA, USA (8-14 July 1991)] IJCNN-91-Seattle International Joint Conference on Neural Networks - Neural classifiers using loss functions
- 作者Hrycej, T.
- 文件大小57.31KB
- 发表时间1991
- DOI10.1109/ijcnn.1991.155547
Measurement and Identification of Three Contributing Charge Terms in Negative Bias Temperature InstabilityMayberry, C.; Nguyen, D. D.; Kouhestani, C.; Kambour, K. E.; Hjalmarson, H. P.; Devine, R. A. B. · ECS Transactions · 2013
Extraction of recoverable and permanent trapped charge resulting from negative bias temperature instabilityNguyen, D. D.; Kouhestani, C.; Kambour, K. E.; Hjalmarson, H. P.; Devine, R. A. B. · physica status solidi (c) · 2013
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[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - Comparison of duty-cycle effects at room temperature in SiON and HfO<inf>2</inf> gate PMOS FETSNguyen, D. D.; Kouhestani, C.; Kambour, K. E.; Bersuker, G.; Devine, R. A. B. · 2014