Mastership in Chemical Analysis
- 期刊名称Analytical Proceedings including Analytical Communications
- 卷第32卷
- 期第7期
- 印刷ISSN0144-557X
- 文件大小312.35KB
- 发表时间1995
- DOI10.1039/ai9953200287
[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced FaultsChun, Sunghoon; Kim, Yongjoon; Kim, Taejin; Yang, Myung-Hoon; Kang, Sungho · 2008
[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based SchemeKim, Taejin; Chun, Sunghoon; Kim, Yongjoon; Yang, Myung-Hoon; Kang, Sungho · 2008
[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip InterconnectionsChun, Sunghoon; Kim, Yongjoon; Kim, Taejin; Kang, Sungho · 2009