![[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - DIBL in short-channel strained-Si n-MOSFET]()
[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - DIBL in short-channel strained-Si n-MOSFETMahato, S. S.; Chakraborty, P.; Maiti, T. K.; Bera, M. K.; Mahata, C.; Sengupta, M.; Chakraborty, A.; Sarkar, S. K.; Maiti, C. K. · 2008